Xi'an Eswin Materials Technology Co., Ltd. and Xi'an Eswin Wafer Technology Co., Ltd. share the China Patent Excellence Award

Xi'an Eswin Materials Technology Co., Ltd. and Xi'an Eswin Wafer Technology Co., Ltd. jointly developed the "method, device, equipment and computer storage medium for controlling the diameter of crystal growth", which enabled them to jointly win the 25th China Patent Excellence Award. The success of this cooperation model has provided new development ideas for other companies in the industry.