Can the macro defect detection products of the company's subsidiary muetec realize wafer inspection during the lithography process?

Tianjue Technology: Hello, thank you for your attention to the company. MueTec's products are aimed at the measurement and inspection of semiconductor front-end wafers, among which the Argos series and Rembrandt series are macro defect detection equipment. The inspection during the photolithography process belongs to micro defect detection.